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1.
Components and metrology for terahertz imaging
by Dietlein, Charles Robert, Ph.D.  University of Colorado at Boulder. 2008: 152 pages; 3315848.
2.
Positioning sensor by combining optical projection and photogrammetry
by Zheng, Benrui, Ph.D.  The University of North Carolina at Charlotte. 2014: 229 pages; 3625067.
3.
Adaptive, Dynamic Surface / Wavefront Metrology and Analysis
by Aftab, Maham, Ph.D.  The University of Arizona. 2019: 144 pages; 13878217.
4.
Studies of Dimensional Metrology with X-Ray Cat Scan
by Villarraga-Gómez, Herminso, Ph.D.  The University of North Carolina at Charlotte. 2018: 670 pages; 10929316.
5.
Synthesis and metrology of conducting carbon nanotube assemblies
by Longson, Timothy Jay, Ph.D.  University of California, Santa Cruz. 2013: 346 pages; 3557994.
6.
Collective State Representation of Atoms in Quantum Computing and Precision Metrology
by Kim, May E., Ph.D.  Northwestern University. 2015: 273 pages; 3741428.
7.
Demonstration of a Closed Loop Digitally Enabled Manufacturing Process Using Advanced Metrology Techniques
by Erickson, Michael, M.S.  The University of North Carolina at Charlotte. 2018: 94 pages; 10811012.
8.
An Assessment of Critical Dimension Small Angle X-ray Scattering Metrology for Advanced Semiconductor Manufacturing
by Settens, Charles M., Ph.D.  State University of New York at Albany. 2015: 239 pages; 3701713.
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12.
On the Estimation of Switching Loss in Wide Band-Gap Power Electronics Systems
by New, Christopher D., M.S.  The University of Alabama. 2019: 107 pages; 27545901.
13.
Optimization of Metrological Characterization of Machining Distortions
by Garcia, Destiny R., Ph.D.  University of California, Davis. 2020: 204 pages; 27667737.
14.
Optical surface characterization with the structure function
by He, Liangyu, Ph.D.  The University of North Carolina at Charlotte. 2013: 188 pages; 3608294.
15.
Fiber Based Tools for Polishing Optical Materials
by Shahinian, Hossein, Ph.D.  The University of North Carolina at Charlotte. 2018: 193 pages; 10786249.
16.
Toward Fixtureless Inspection of Automotive Fenders
by Grohol, Corbin Michael, M.S.  The University of North Carolina at Charlotte. 2018: 103 pages; 13421638.
17.
Hot Beats and Tune Outs: Atom Interferometry with Laser-Cooled Lithium
by Cassella, Kayleigh, Ph.D.  University of California, Berkeley. 2018: 193 pages; 10822165.
18.
Robust Image-Based Wavefront Sensing
by Zielinski, Thomas P., Ph.D.  University of Rochester. 2011: 193 pages; 3478385.
20.
Physiological effects of monocular display augmented, articulated arm-based laser digitizing
by Littell, William Neil, Ph.D.  Mississippi State University. 2013: 125 pages; 3558911.
22.
Discourse on the Characterization of Waveguide Distributed Bragg Reflectors for Application to Nonlinear Optics
by Grieco, Andrew Lewis, Ph.D.  University of California, San Diego. 2014: 101 pages; 3624856.
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24.
Development and Application of IDMS Based Procedure for Total Sulphur in Copper Metals and Its Alloys
by Phukphatthanachai, Pranee, Ph.D.  Humboldt Universitaet zu Berlin (Germany). 2019: 144 pages; 27732413.
25.
Application of phase retrieval to the measurement of optical surfaces and wavefronts
by Brady, Gregory R., Ph.D.  University of Rochester. 2009: 228 pages; 3343596.
26.
The Social Life of Measures Metrication in the United States and Mexico, 1789–2004
by Vera, Hector, Ph.D.  New School University. 2012: 514 pages; 3495843.
28.
Nanofabrication on engineered silicon (100) surfaces using scanning probe microscopy
by Li, Kai, Ph.D.  University of Maryland, College Park. 2011: 184 pages; 3517951.
29.
Table-top, full-field, actinic microscope for Extreme Ultraviolet Lithography mask characterization
by Brizuela, Fernando, Ph.D.  Colorado State University. 2010: 117 pages; 3451866.
30.
Advances in Deterministic Femtosecond Laser Writing of Vision Correction Devices in Ophthalmic Hydrogels
by Gandara-Montano, Gustavo A., Ph.D.  University of Rochester. 2019: 379 pages; 13856499.
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