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1.
Studies of Dimensional Metrology with X-Ray Cat Scan
by Villarraga-Gómez, Herminso, Ph.D.  The University of North Carolina at Charlotte. 2018: 670 pages; 10929316.
2.
Positioning sensor by combining optical projection and photogrammetry
by Zheng, Benrui, Ph.D.  The University of North Carolina at Charlotte. 2014: 229 pages; 3625067.
3.
Demonstration of a Closed Loop Digitally Enabled Manufacturing Process Using Advanced Metrology Techniques
by Erickson, Michael, M.S.  The University of North Carolina at Charlotte. 2018: 94 pages; 10811012.
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Adaptive, Dynamic Surface / Wavefront Metrology and Analysis
by Aftab, Maham, Ph.D.  The University of Arizona. 2019: 144 pages; 13878217.
6.
An Assessment of Critical Dimension Small Angle X-ray Scattering Metrology for Advanced Semiconductor Manufacturing
by Settens, Charles M., Ph.D.  State University of New York at Albany. 2015: 239 pages; 3701713.
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Quantum Imaging and Information
by Dixon, P. Benjamin, Ph.D.  University of Rochester. 2011: 113 pages; 3498231.
9.
Components and metrology for terahertz imaging
by Dietlein, Charles Robert, Ph.D.  University of Colorado at Boulder. 2008: 152 pages; 3315848.
10.
Synthesis and metrology of conducting carbon nanotube assemblies
by Longson, Timothy Jay, Ph.D.  University of California, Santa Cruz. 2013: 346 pages; 3557994.
12.
The Social Life of Measures Metrication in the United States and Mexico, 1789–2004
by Vera, Hector, Ph.D.  New School University. 2012: 514 pages; 3495843.
13.
Surface accuracy analysis and mathematical modeling of deployable large aperture elastic antenna reflectors
by Coleman, Michael J., Ph.D.  The George Washington University. 2010: 108 pages; 3409490.
15.
Collective State Representation of Atoms in Quantum Computing and Precision Metrology
by Kim, May E., Ph.D.  Northwestern University. 2015: 273 pages; 3741428.
17.
Nanofabrication on engineered silicon (100) surfaces using scanning probe microscopy
by Li, Kai, Ph.D.  University of Maryland, College Park. 2011: 184 pages; 3517951.
18.
Optical surface characterization with the structure function
by He, Liangyu, Ph.D.  The University of North Carolina at Charlotte. 2013: 188 pages; 3608294.
19.
Application of phase retrieval to the measurement of optical surfaces and wavefronts
by Brady, Gregory R., Ph.D.  University of Rochester. 2009: 228 pages; 3343596.
20.
Toward Fixtureless Inspection of Automotive Fenders
by Grohol, Corbin Michael, M.S.  The University of North Carolina at Charlotte. 2018: 103 pages; 13421638.
22.
Table-top, full-field, actinic microscope for Extreme Ultraviolet Lithography mask characterization
by Brizuela, Fernando, Ph.D.  Colorado State University. 2010: 117 pages; 3451866.
23.
Robust and efficient inference of scene and object motion in multi-camera systems
by Sankaranarayanan, Aswin C., Ph.D.  University of Maryland, College Park. 2009: 181 pages; 3391385.
24.
Advances in Deterministic Femtosecond Laser Writing of Vision Correction Devices in Ophthalmic Hydrogels
by Gandara-Montano, Gustavo A., Ph.D.  University of Rochester. 2019: 379 pages; 13856499.
25.
Freeform solar concentrating optics
by Wheelwright, Brian, Ph.D.  The University of Arizona. 2015: 140 pages; 3719119.
26.
Interferometric detection of proteins
by Zhao, Ming, Ph.D.  Purdue University. 2009: 206 pages; 3379631.
27.
Fiber Based Tools for Polishing Optical Materials
by Shahinian, Hossein, Ph.D.  The University of North Carolina at Charlotte. 2018: 193 pages; 10786249.
28.
Design and development of the roller imprinting process
by Vijayaraghavan, Athulan, Ph.D.  University of California, Berkeley. 2009: 219 pages; 3369206.
29.
Spatio-Spectral Interferometric Imaging and the Wide-Field Imaging Interferometry Testbed
by Iacchetta, Alexander S., Ph.D.  University of Rochester. 2018: 153 pages; 10936092.
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