We have investigated ion beam assisted deposited (IBAD) coated conductors by scanning laser microscopy (SLM) to map how current flows in transition and superconducting regions. Our goal was to investigate the grain size and the factors to influencing the current distribution. Our results indicate that the non-uniform current distribution was generated by the grain boundary network and macroscopic defects. We estimate the grain cluster size from SLM to be 40 μm to 160 μm. Below the critical temperature, we investigated the local critical current (I_c*), the temperature at which SLM has the maximum signal (T_c*), and the maximum SLM voltage (δV _max) as well as their relationship. We find that the weakest superconducting area with lower I_c* has lower T_c* and higher δV _max. We have also observed interesting dots on the sample that have definitely higher T_c*.