Dissertation/Thesis Abstract

Applications of frustrated total internal reflection for short interaction length devices in photonic integrated circuits
by Huntoon, Nathan R., Ph.D., Southern Methodist University, 2009, 116; 3366145
Abstract (Summary)

The use of frustrated total internal reflection in making short interaction length components to be utilized in photonic integrated circuits will be presented. In addition to traditional frustrated total internal reflection, the plane wave solutions for frustrated total internal reflection across an active medium are developed and presented. Devices based both upon the passive frustrated total internal reflection and enhance frustrated total internal reflection are presented. Analytical parameterization of the devices is presented along with numerical simulation results.

Indexing (document details)
Advisor: Christensen, Marc P.
Commitee: Butler, Jerome, Evans, Gary, Tausch, Johannes, Vega, Robert
School: Southern Methodist University
Department: Electrical Engineering
School Location: United States -- Texas
Source: DAI-B 70/07, Dissertation Abstracts International
Subjects: Electrical engineering, Optics
Keywords: EFTIR, Enhanced FTIR, FTIR, Finite-difference time domain, Frustrated total internal reflection, Goos-Hanchen shift, Photonic integrated circuits
Publication Number: 3366145
ISBN: 978-1-109-26792-1
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