The use of frustrated total internal reflection in making short interaction length components to be utilized in photonic integrated circuits will be presented. In addition to traditional frustrated total internal reflection, the plane wave solutions for frustrated total internal reflection across an active medium are developed and presented. Devices based both upon the passive frustrated total internal reflection and enhance frustrated total internal reflection are presented. Analytical parameterization of the devices is presented along with numerical simulation results.
|Advisor:||Christensen, Marc P.|
|Commitee:||Butler, Jerome, Evans, Gary, Tausch, Johannes, Vega, Robert|
|School:||Southern Methodist University|
|School Location:||United States -- Texas|
|Source:||DAI-B 70/07, Dissertation Abstracts International|
|Subjects:||Electrical engineering, Optics|
|Keywords:||EFTIR, Enhanced FTIR, FTIR, Finite-difference time domain, Frustrated total internal reflection, Goos-Hanchen shift, Photonic integrated circuits|
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