Metal whisker formation has been an unwanted byproduct in electronics for the past 70 years. However, in that period, no one has come up with one mechanism that can explain all the collected data. This dissertation focuses on copper whisker formation in the presence of a sulfur-containing compound.
Pulsed laser deposition is used to create a molybdenum disulfide thin film, and the resulting whiskers are analyzed with scanning electron microscopy and x-ray photoelectron spectroscopy. The copper whiskers are proven to be pure copper and can be several millimeters in length.
The collected data supports a recrystallization-based mechanism, where the copper vapor on the surface recrystallizes at the base of the copper whisker, therefore, adding to the length of the whisker.
|Commitee:||Sulkes, Mark, Herman, Mike, McPherson, Gary|
|School:||Tulane University School of Science and Engineering|
|School Location:||United States -- Louisiana|
|Source:||DAI-B 82/2(E), Dissertation Abstracts International|
|Subjects:||Materials science, Chemistry, Physical chemistry|
|Keywords:||Copper, Materials, Metals, SEM, Whiskers, Wires|
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