Dissertation/Thesis Abstract

Magnetic Force Microscopy of Permalloy Thin Films on Nanosphere Templates
by Baker, Terence Lee, M.S., California State University, Long Beach, 2019, 76; 13426819
Abstract (Summary)

Magnetic Force Microscopy (MFM) is a viable method of analyzing magnetic characteristics of ferromagnetic nanostructure materials. The nanosphere template produces a variety of magnetic domains for the endeavor of advancing technological applications such as nanomagnetic logic and magnetoplasmonic nanoparticles. These nanomagnetic applications demand very specific magnetic characteristics, so the profiling of different magnetic domains using magnetic force microscopy is essential. During this work, we studied the magnetic domains that came from permalloy material on nanosphere templates. We investigated the most optimal MFM scan parameters that could produce a viable and trustworthy magnetic domain image. After analyzing two types of samples with different nanosphere template arrangements scanned at two scan angles, 0° and 90°, relative to the cantilever, it was concluded that both scan angles produced optimal images. The optimal lift scan height, relative to the sample surface, was determined to be 65 nm away, where the magnetic domain is most accurately observed. When the tip magnetization was reversed, the MFM images show a corresponding flipping of the magnetic domain characteristics, but maintained the domain size and pattern. Further research is needed to determine the cause of magnetic domain ripples that appear in images.

Indexing (document details)
Advisor: Kwon, Chuhee
Commitee: Gu, Jiyeong, Peterson, Michael
School: California State University, Long Beach
Department: Physics and Astronomy
School Location: United States -- California
Source: MAI 58/05M(E), Masters Abstracts International
Subjects: Applied physics, Physics
Publication Number: 13426819
ISBN: 9781392097304
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