Dissertation/Thesis Abstract

Duty-Cycle Based Physical Unclonable Functions (PUFs) for Hardware Security Applications
by Azhar, Mahmood Javed, Ph.D., University of South Florida, 2018, 100; 10980455
Abstract (Summary)

Duty cycle and frequency are important characteristics of periodic signals that are exploited to develop a variety of application circuits in IC design. Controlling the duty cycle and frequency provides a method to develop adaptable circuits for a variety of applications. These applications range from stable on-chip clock generation circuits, on-chip voltage regulation circuits, and Physical unclonable functions for hardware security applications. Ring oscillator circuits that are developed with CMOS inverter circuits provide a simple, versatile flexible method to generated periodic signals on an IC chip. A digitally controlled ring oscillator circuit can be adapted to control its duty cycle and frequency. This work describes a novel current starved ring oscillator, with digitally controlled current source based headers and footers, that is used to provide a versatile duty cycle and a precise frequency control. Using this novel circuit, the duty cycle and frequency can be adapted to a wide range of values. The proposed circuit achieves i) a controlled duty cycle that can vary between 20% and 90% with a high granularity and ii) a compensation circuit that guarantees a constant duty cycle under process, voltage, and temperature (PVT) variations.

A novel application of the proposed PWM circuit is the design and demonstration of a reliable and reconfigurable Duty-cycle based Physical unclonable function (PUF). The proposed PWM based PUF circuit is demonstrated to work in a reliable and stable operation for a variety of process, voltage and temperature conditions with circuit implementations using 22nm and 32nm CMOS technologies. A comparative presentation of the duty cycle based PUF are provided using standard PUF figures of merits.

Indexing (document details)
Advisor: Kose, Selcuk
Commitee: Amsaad, Fathi, Bhanja, Sanjukta, Kermani, Mehran M., Uysal, Ismail
School: University of South Florida
Department: Computer Science and Engineering
School Location: United States -- Florida
Source: DAI-B 80/05(E), Dissertation Abstracts International
Subjects: Engineering, Electrical engineering
Keywords: Process, Puf, Pvt, Regulator, Temperature, Voltage
Publication Number: 10980455
ISBN: 9780438780439
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