Dissertation/Thesis Abstract

FPGA implementation of self testing USART
by Rana, Vireshsingh, M.S./M.P.H., California State University, Long Beach, 2016, 37; 10141518
Abstract (Summary)

The Very Large Scale Integration (VLSI) industry consists of Integrated circuit (IC). As the complexity of VLSI components increase, so does their testing. An IC should be tested thoroughly before it is presented in a market. A minor defect in an IC can render a system useless. The Built-in Self-Test (BIST) technique, which ensures all connections are properly established, is primarily used in the aviation industry, where each piece of equipment must have a back-up in case of failure.

The Universal Synchronous/Asynchronous Receiver and Transmitter (USART) is used as a communication protocol across the electronics industry. The project builds an affordable, self-testing USART. The USART is implemented and evaluated on a Field Programmable Gate Array (FPGA) using the BIST technique. The BIST technique reduces the cost of IC testing by eliminating the use of external testing hardware. The testing technique ensures that the functional specifications of USART are met.

Indexing (document details)
Advisor: Wagdy, Mahmoud
Commitee: Ary, James, Khoo, I-Hung
School: California State University, Long Beach
Department: Electrical Engineering
School Location: United States -- California
Source: MAI 55/06M(E), Masters Abstracts International
Subjects: Electrical engineering
Publication Number: 10141518
ISBN: 978-1-339-96878-0
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