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Dissertation/Thesis Abstract

Genetics and quantitative trait loci mapping of septoria tritici blotch resistance, agronomic, and quality traits in wheat
by Harilal, Vibin Eranezhath, M.S., North Dakota State University, 2011, 108; 1540893
Abstract (Summary)

Most breeding programs aim at developing superior germplasm and better cultivars that combine high yield, disease and pest resistance, and end-use quality to satisfy the requirements of the growers as well as industry. A population, consisting of 138 F2-8 recombinant inbred lines (RILs) derived from a cross between 'Steele-ND' and ND 735, was evaluated to study the inheritance pattern of the septoria tritici blotch (STB)-resistant genes, agronomic and quality traits. The genetic map of this population was generated using Diversity Arrays Technology (DArT) (Triticarte Pty. Ltd., Canberra, Australia), a high-throughput genome analysis method. The framework map made of 392 markers, including 28 simple sequence repeat (SSR) markers and 364 DArT markers, spanned a total distance of 1789.3 cM and consisted of 17 linkage groups. The map position of quantitative trait loci (QTL) found in this study coincided with the map position of durable STB resistance genes, Stb1. Thirteen QTL were detected for agronomic and quality traits. More saturation of the current map is needed to explore more QTL for this population.

Indexing (document details)
Advisor: Mergoum, Mohamed
Commitee: Acevedo, Maircelis, Kianian, Shahryar, Simsek, Senay, Xu, Steven
School: North Dakota State University
Department: Plant Sciences
School Location: United States -- North Dakota
Source: MAI 52/01M(E), Masters Abstracts International
Subjects: Agronomy, Plant sciences
Keywords: QTL mapping, Septoria tritici blotch
Publication Number: 1540893
ISBN: 978-1-303-21654-1
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